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Information card for entry 4117156
Preview
| Coordinates | 4117156.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H24 N3 O3 |
|---|---|
| Calculated formula | C16 H24 N3 O3 |
| SMILES | C12N(N(C(CC1)CC2)C(C)(C)C)c1ccccc1.N(=O)(=O)[O-] |
| Title of publication | Charge Localization in a Dihydrazine Analogue of Tetramethyl-p-phenylenediamine Radical Cation |
| Authors of publication | Stephen F. Nelsen; Rustem F. Ismagilov; Douglas R. Powell |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 1996 |
| Journal volume | 118 |
| Pages of publication | 6313 - 6314 |
| a | 8.0115 ± 0.0004 Å |
| b | 12.8872 ± 0.0006 Å |
| c | 15.3184 ± 0.0007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1581.56 ± 0.13 Å3 |
| Cell temperature | 133 ± 2 K |
| Ambient diffraction temperature | 133 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0361 |
| Residual factor for significantly intense reflections | 0.0336 |
| Weighted residual factors for all reflections | 0.0862 |
| Weighted residual factors for significantly intense reflections | 0.0828 |
| Goodness-of-fit parameter for all reflections | 1.073 |
| Goodness-of-fit parameter for significantly intense reflections | 1.052 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4117156.html
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Users of the data should acknowledge the original authors of the
structural data.