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Information card for entry 4117442
Preview
| Coordinates | 4117442.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C21 H27 Al Cl Mn N2 O2 |
|---|---|
| Calculated formula | C21 H27 Al Cl Mn N2 O2 |
| SMILES | [Mn]123456([Al]7(Cl)([N](=C(N7C(C)C)c7ccccc7)C(C)C)(C5=O)[H]6)([cH]5[cH]4[c]3([cH]2[cH]15)C)C#[O] |
| Title of publication | σ-Alane Complexes of Chromium, Tungsten, and Manganese |
| Authors of publication | Ian M. Riddlestone; Siân Edmonds; Paul A. Kaufman; Juan Urbano Baena; Joshua I. Bates; Michael J. Kelly; Amber L. Thompson; Russell Taylor; Simon Aldridge |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2012 |
| Journal volume | 134 |
| Pages of publication | 2551 - 2554 |
| a | 9.9819 ± 0.0002 Å |
| b | 10.0605 ± 0.0002 Å |
| c | 12.3107 ± 0.0003 Å |
| α | 83.6209 ± 0.0008° |
| β | 69.1742 ± 0.0008° |
| γ | 76.6715 ± 0.001° |
| Cell volume | 1123.8 ± 0.04 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0517 |
| Residual factor for significantly intense reflections | 0.034 |
| Weighted residual factors for all reflections | 0.0711 |
| Weighted residual factors for significantly intense reflections | 0.0571 |
| Weighted residual factors for all reflections included in the refinement | 0.0711 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.9218 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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