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Information card for entry 4118177
Preview
| Coordinates | 4118177.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Sm@(C1-42-C92).NiOEP.2toluene |
|---|---|
| Formula | C142 H60 N4 Ni Sm |
| Calculated formula | C139.5 H57 N4 Ni Sm |
| Title of publication | Single Samarium Atoms in Large Fullerene Cages. Characterization of Two Isomers of Sm@C92 and Four Isomers of Sm@C94 with the X-ray Crystallographic Identification of Sm@C1(42)-C92, Sm@Cs(24)-C92, and Sm@C3v(134)-C94 |
| Authors of publication | Hongxiao Jin; Hua Yang; Meilan Yu; Ziyang Liu; Christine M. Beavers; Marilyn M. Olmstead; Alan L. Balch |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2012 |
| Journal volume | 134 |
| Pages of publication | 10933 - 10941 |
| a | 25.5517 ± 0.0007 Å |
| b | 15.3002 ± 0.0004 Å |
| c | 20.8629 ± 0.0006 Å |
| α | 90° |
| β | 95.307 ± 0.004° |
| γ | 90° |
| Cell volume | 8121.3 ± 0.4 Å3 |
| Cell temperature | 90 ± 2 K |
| Ambient diffraction temperature | 90 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0853 |
| Residual factor for significantly intense reflections | 0.0603 |
| Weighted residual factors for significantly intense reflections | 0.1615 |
| Weighted residual factors for all reflections included in the refinement | 0.1813 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4118177.html
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