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Information card for entry 4118183
Preview
| Coordinates | 4118183.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C114 H108 F6 N12 O22 Pd2 S2 |
|---|---|
| Calculated formula | C114 H108 F6 N12 O22 Pd2 S2 |
| SMILES | c1ccc2c[n]1[Pd]13[n]4cccc(c4)COc4ccc(cc4)C(=O)c4ccc(cc4)OCc4ccc[n](c4)[Pd]([n]4cccc(c4)COc4ccc(cc4)C(=O)c4ccc(OCc5ccc[n]1c5)cc4)([n]1cccc(c1)COc1ccc(cc1)C(=O)c1ccc(OC2)cc1)[n]1cccc(c1)COc1ccc(cc1)C(=O)c1ccc(cc1)OCc1ccc[n]3c1.FC(F)(F)S(=O)(=O)[O-].N(C)(C)C=O.C(=O)N(C)C.FC(F)(F)S(=O)(=O)[O-].N(C=O)(C)C.N(C)(C)C=O |
| Title of publication | Anion-Directed Formation and Degradation of an Interlocked Metallohelicate |
| Authors of publication | Ryo Sekiya; Morihiko Fukuda; Reiko Kuroda |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2012 |
| Journal volume | 134 |
| Pages of publication | 10987 - 10997 |
| a | 9.7036 ± 0.0005 Å |
| b | 16.2275 ± 0.0017 Å |
| c | 22.5692 ± 0.0011 Å |
| α | 80.041 ± 0.002° |
| β | 87.649 ± 0.006° |
| γ | 86.36 ± 0.004° |
| Cell volume | 3491.6 ± 0.4 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1935 |
| Residual factor for significantly intense reflections | 0.1139 |
| Weighted residual factors for significantly intense reflections | 0.3 |
| Weighted residual factors for all reflections included in the refinement | 0.3284 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.962 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4118183.html
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Users of the data should acknowledge the original authors of the
structural data.