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Information card for entry 4118631
Preview
| Coordinates | 4118631.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C37 H72 N3 P Si6 Te U |
|---|---|
| Calculated formula | C37 H72 N3 P Si6 Te U |
| SMILES | [U](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)=[Te].[P+](c1ccccc1)(c1ccccc1)(C)c1ccccc1 |
| Title of publication | A Complete Family of Terminal Uranium Chalcogenides, [U(E)(N{SiMe3}2)3]- (E = O, S, Se, Te) |
| Authors of publication | Jessie L. Brown; Skye Fortier; Richard A. Lewis; Guang Wu; Trevor W. Hayton |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2012 |
| Journal volume | 134 |
| Pages of publication | 15468 - 15475 |
| a | 17.154 ± 0.0004 Å |
| b | 12.0776 ± 0.0003 Å |
| c | 24.4001 ± 0.0006 Å |
| α | 90° |
| β | 100.31 ± 0.001° |
| γ | 90° |
| Cell volume | 4973.6 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0634 |
| Residual factor for significantly intense reflections | 0.0354 |
| Weighted residual factors for significantly intense reflections | 0.0632 |
| Weighted residual factors for all reflections included in the refinement | 0.0712 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.001 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4118631.html
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