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Information card for entry 4119638
Preview
| Coordinates | 4119638.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | 4a |
|---|---|
| Formula | C26 H36 Cl4 N2 W |
| Calculated formula | C26 H36 Cl4 N2 W |
| SMILES | C1C=[N]([W]([N]=1c1c(cccc1C(C)C)C(C)C)(Cl)(Cl)(Cl)Cl)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Salt-Free Reducing Reagent of Bis(trimethylsilyl)cyclohexadiene Mediates Multielectron Reduction of Chloride Complexes of W(VI) and W(IV) |
| Authors of publication | Hayato Tsurugi; Hiromasa Tanahashi; Haruka Nishiyama; Waldemar Fegler; Teruhiko Saito; Andreas Sauer; Jun Okuda; Kazushi Mashima |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2013 |
| Journal volume | 135 |
| Pages of publication | 5986 - 5989 |
| a | 12.7024 ± 0.0017 Å |
| b | 21.299 ± 0.003 Å |
| c | 10.4913 ± 0.0015 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2838.4 ± 0.7 Å3 |
| Cell temperature | 113 ± 2 K |
| Ambient diffraction temperature | 113 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.1223 |
| Residual factor for significantly intense reflections | 0.1107 |
| Weighted residual factors for significantly intense reflections | 0.3289 |
| Weighted residual factors for all reflections included in the refinement | 0.3509 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.552 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4119638.html
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Users of the data should acknowledge the original authors of the
structural data.