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Information card for entry 4120085
Preview
| Coordinates | 4120085.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C216 H160 Fe4 N8 O68 P8 Pt4 S8 |
|---|---|
| Calculated formula | C216 H160 Fe4 N8 O68 P8 Pt4 S8 |
| SMILES | C12=C3c4ccccc4C(c4ccccc34)=C3SC4=C(S3)c3cc[n](cc3)[Pt]3([n]5ccc(C6=C(c7cc[n](cc7)[Pt]7([n]8ccc4cc8)[P]([c]48[cH]9[cH]%10[cH]%11[cH]4[Fe]4%12%13%1489%10%11[c]8([P]7(c7ccccc7)c7ccccc7)[cH]4[cH]%12[cH]%13[cH]%148)(c4ccccc4)c4ccccc4)SC(=C4c7ccccc7C(c7ccccc47)=C4SC7=C(S4)c4cc[n]([Pt]8([n]9ccc(C(=C(S2)c2cc[n](cc2)[Pt]2([n]%10ccc7cc%10)[P]([c]7%10[cH]%11[cH]%12[cH]%13[cH]7[Fe]7%14%15%16%10%11%12%13[c]%10([P]2(c2ccccc2)c2ccccc2)[cH]7[cH]%14[cH]%15[cH]%16%10)(c2ccccc2)c2ccccc2)S1)cc9)[P]([c]12[cH]7[cH]9[cH]%10[cH]1[Fe]1%11%12%13279%10[c]2([cH]1[cH]%11[cH]%12[cH]%132)[P]8(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)cc4)S6)cc5)[P]([c]12[cH]4[cH]5[cH]6[cH]1[Fe]17892456[c]2([P]3(c3ccccc3)c3ccccc3)[cH]1[cH]7[cH]8[cH]92)(c1ccccc1)c1ccccc1.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O |
| Title of publication | Self-Assembled Containers Based on Extended Tetrathiafulvalene |
| Authors of publication | Sébastien Bivaud; Sébastien Goeb; Vincent Croué; Paul I. Dron; Magali Allain; Marc Sallé |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2013 |
| Journal volume | 135 |
| Pages of publication | 10018 - 10021 |
| a | 20.05 ± 0.007 Å |
| b | 23.801 ± 0.001 Å |
| c | 29.706 ± 0.005 Å |
| α | 90° |
| β | 109.59 ± 0.02° |
| γ | 90° |
| Cell volume | 13355 ± 5 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.4583 |
| Residual factor for significantly intense reflections | 0.1559 |
| Weighted residual factors for significantly intense reflections | 0.349 |
| Weighted residual factors for all reflections included in the refinement | 0.5275 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.151 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4120085.html
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