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Information card for entry 4121215
Preview
| Coordinates | 4121215.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C126 H154 N4 P6 Pt4 Si6 |
|---|---|
| Calculated formula | C126 H154 N4 P6 Pt4 Si6 |
| Title of publication | From a Zwitterionic Phosphasilene to Base Stabilized Silyliumylidene-Phosphide and Bis(silylene) Complexes |
| Authors of publication | Nora C. Breit; Tibor Szilvási; Tsuyoshi Suzuki; Daniel Gallego; Shigeyoshi Inoue |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2013 |
| Journal volume | 135 |
| Pages of publication | 17958 - 17968 |
| a | 10.068 ± 0.005 Å |
| b | 24.162 ± 0.005 Å |
| c | 26.174 ± 0.005 Å |
| α | 90 ± 0.005° |
| β | 99.656 ± 0.005° |
| γ | 90 ± 0.005° |
| Cell volume | 6277 ± 4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0437 |
| Residual factor for significantly intense reflections | 0.034 |
| Weighted residual factors for significantly intense reflections | 0.0957 |
| Weighted residual factors for all reflections included in the refinement | 0.0978 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.447 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4121215.html
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