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Information card for entry 4122257
Preview
| Coordinates | 4122257.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H40 Au O4 P Si |
|---|---|
| Calculated formula | C40 H40 Au O4 P Si |
| SMILES | C(=C(/C(=O)OC)[Au][Si](c1ccccc1)(c1ccccc1)C(C)(C)C)(/C(=O)OC)[P+](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Mechanisms of syn-Insertion of Alkynes and Allenes into Gold-Silicon Bonds: A Comprehensive Experimental/Theoretical Study. |
| Authors of publication | Joost, Maximilian; Estevez, Laura; Mallet-Ladeira, Sonia; Miqueu, Karinne; Amgoune, Abderrahmane; Bourissou, Didier |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2014 |
| Journal volume | 136 |
| Journal issue | 29 |
| Pages of publication | 10373 - 10382 |
| a | 9.9038 ± 0.0004 Å |
| b | 10.2229 ± 0.0004 Å |
| c | 19.6958 ± 0.0009 Å |
| α | 83.143 ± 0.002° |
| β | 86.242 ± 0.002° |
| γ | 65.473 ± 0.002° |
| Cell volume | 1800.92 ± 0.13 Å3 |
| Cell temperature | 193 ± 2 K |
| Ambient diffraction temperature | 193 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0165 |
| Residual factor for significantly intense reflections | 0.0148 |
| Weighted residual factors for significantly intense reflections | 0.0359 |
| Weighted residual factors for all reflections included in the refinement | 0.0366 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4122257.html
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Users of the data should acknowledge the original authors of the
structural data.