Information card for entry 4122593
| Chemical name |
1,1,4,4-Tetra-tert-butyl-2,2,3,3-tetrachloro-5,5,6,6-tetramethylcyclohexasilane |
| Formula |
C20 H48 Cl4 Si6 |
| Calculated formula |
C20 H48 Cl4 Si6 |
| SMILES |
[Si]1([Si]([Si]([Si]([Si]([Si]1(C(C)(C)C)C(C)(C)C)(Cl)Cl)(Cl)Cl)(C(C)(C)C)C(C)(C)C)(C)C)(C)C |
| Title of publication |
Tetrasilane-bridged bicyclo[4.1.0]heptasil-1(6)-ene. |
| Authors of publication |
Tsurusaki, Akihiro; Kamiyama, Jun; Kyushin, Soichiro |
| Journal of publication |
Journal of the American Chemical Society |
| Year of publication |
2014 |
| Journal volume |
136 |
| Journal issue |
37 |
| Pages of publication |
12896 - 12898 |
| a |
9.1903 ± 0.0005 Å |
| b |
21.5113 ± 0.0011 Å |
| c |
16.6086 ± 0.001 Å |
| α |
90° |
| β |
96.652 ± 0.0008° |
| γ |
90° |
| Cell volume |
3261.3 ± 0.3 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0444 |
| Residual factor for significantly intense reflections |
0.0425 |
| Weighted residual factors for significantly intense reflections |
0.0813 |
| Weighted residual factors for all reflections included in the refinement |
0.0826 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.28 |
| Diffraction radiation wavelength |
0.7107 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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