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Information card for entry 4123163
Preview
| Coordinates | 4123163.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | La2C80(C3N3(C6H5)2) |
|---|---|
| Formula | C96 H10 La2 N3 S2 |
| Calculated formula | C96 H10 La2.001 N3 S2 |
| Title of publication | Hiding and recovering electrons in a dimetallic endohedral fullerene: air-stable products from radical additions. |
| Authors of publication | Yamada, Michio; Kurihara, Hiroki; Suzuki, Mitsuaki; Saito, Masayoshi; Slanina, Zdenek; Uhlik, Filip; Aizawa, Toshihiro; Kato, Tatsuhisa; Olmstead, Marilyn M.; Balch, Alan L.; Maeda, Yutaka; Nagase, Shigeru; Lu, Xing; Akasaka, Takeshi |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2015 |
| Journal volume | 137 |
| Journal issue | 1 |
| Pages of publication | 232 - 238 |
| a | 22.0705 ± 0.0016 Å |
| b | 10.9858 ± 0.0008 Å |
| c | 22.3824 ± 0.0017 Å |
| α | 90° |
| β | 114.202 ± 0.004° |
| γ | 90° |
| Cell volume | 4949.9 ± 0.7 Å3 |
| Cell temperature | 90 K |
| Ambient diffraction temperature | 90 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.2014 |
| Residual factor for significantly intense reflections | 0.1638 |
| Weighted residual factors for significantly intense reflections | 0.384 |
| Weighted residual factors for all reflections included in the refinement | 0.4044 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.171 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4123163.html
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