Information card for entry 4123685
| Formula |
C18 H8 S4 |
| Calculated formula |
C18 H8 S4 |
| SMILES |
s1ccc2c1cc1sc3c(sc4c3cc3c(scc3)c4)c1c2 |
| Title of publication |
Dibenzothiopheno[6,5-b:6',5'-f]thieno[3,2-b]thiophene (DBTTT): High-Performance Small-Molecule Organic Semiconductor for Field-Effect Transistors. |
| Authors of publication |
Park, Jeong-Il; Chung, Jong Won; Kim, Joo-Young; Lee, Jiyoul; Jung, Ji Young; Koo, Bonwon; Lee, Bang-Lin; Lee, Soon W.; Jin, Yong Wan; Lee, Sang Yoon |
| Journal of publication |
Journal of the American Chemical Society |
| Year of publication |
2015 |
| Journal volume |
137 |
| Journal issue |
38 |
| Pages of publication |
12175 - 12178 |
| a |
5.9129 ± 0.0001 Å |
| b |
7.8545 ± 0.0002 Å |
| c |
31.0943 ± 0.0008 Å |
| α |
90° |
| β |
91.527 ± 0.001° |
| γ |
90° |
| Cell volume |
1443.6 ± 0.06 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0941 |
| Residual factor for significantly intense reflections |
0.0738 |
| Weighted residual factors for significantly intense reflections |
0.1626 |
| Weighted residual factors for all reflections included in the refinement |
0.172 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.152 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/4123685.html