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Information card for entry 4123754
Preview
| Coordinates | 4123754.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H20 Ca O8 Xe1.45 |
|---|---|
| Calculated formula | C34 H20 Ca O8 Xe1.454 |
| Title of publication | Direct Observation of Xe and Kr Adsorption in a Xe-Selective Microporous Metal-Organic Framework. |
| Authors of publication | Chen, Xianyin; Plonka, Anna M.; Banerjee, Debasis; Krishna, Rajamani; Schaef, Herbert T.; Ghose, Sanjit; Thallapally, Praveen K.; Parise, John B. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2015 |
| Journal volume | 137 |
| Journal issue | 22 |
| Pages of publication | 7007 - 7010 |
| a | 5.1812 ± 0.0003 Å |
| b | 10.742 ± 0.0006 Å |
| c | 15.1224 ± 0.0006 Å |
| α | 82.466 ± 0.004° |
| β | 84.928 ± 0.004° |
| γ | 82.691 ± 0.005° |
| Cell volume | 825.41 ± 0.07 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0568 |
| Residual factor for significantly intense reflections | 0.0423 |
| Weighted residual factors for significantly intense reflections | 0.1018 |
| Weighted residual factors for all reflections included in the refinement | 0.1112 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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