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Information card for entry 4123783
Preview
| Coordinates | 4123783.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C40 H56 N4 Ni2 Si |
|---|---|
| Calculated formula | C40 H56 N4 Ni2 Si |
| SMILES | [Ni]1234[N](=C(c5[n]3c3[n]6[Ni]71([N](=C(c6ccc3cc5)C)c1c(cccc1C(C)C)C(C)C)[Si]2(CC)(CC)([H]4)[H]7)C)c1c(cccc1C(C)C)C(C)C |
| Title of publication | Reversible substrate activation and catalysis at an intact metal-metal bond using a redox-active supporting ligand. |
| Authors of publication | Steiman, Talia J.; Uyeda, Christopher |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2015 |
| Journal volume | 137 |
| Journal issue | 18 |
| Pages of publication | 6104 - 6110 |
| a | 8.336 ± 0.0005 Å |
| b | 14.5421 ± 0.0005 Å |
| c | 16.3083 ± 0.0006 Å |
| α | 77.782 ± 0.002° |
| β | 86.567 ± 0.004° |
| γ | 77.599 ± 0.004° |
| Cell volume | 1886.87 ± 0.15 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0491 |
| Residual factor for significantly intense reflections | 0.0468 |
| Weighted residual factors for significantly intense reflections | 0.1345 |
| Weighted residual factors for all reflections included in the refinement | 0.1376 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.135 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4123783.html
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