Information card for entry 4124627

Structure parameters

• Formula: F14 O10 Re4 Xe3
• Calculated formula: F14 O10 Re4 Xe3
• SMILES: [F]([Re]([F][Re](F)(F)(F)(=O)=O)(F)(F)(=O)=O)[Xe]O[Xe]O[Xe][F][Re]([F][Re](F)(F)(F)(=O)=O)(F)(F)(=O)=O
• Title of publication: [XeOXeOXe](2+), the Missing Oxide of Xenon(II); Synthesis, Raman Spectrum, and X-ray Crystal Structure of [XeOXeOXe][μ-F(ReO2F3)2]2.
• Authors of publication: Ivanova, Maria V.; Mercier, Hélène P A; Schrobilgen, Gary J.
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2015
• Journal volume: 137
• Journal issue: 41
• Pages of publication: 13398 - 13413
• a: 7.7142 ± 0.0002 Å
• b: 8.0991 ± 0.0002 Å
• c: 10.0494 ± 0.0002 Å
• α: 88.2797 ± 0.0013°
• β: 69.1278 ± 0.0012°
• γ: 62.0249 ± 0.0012°
• Cell volume: 510.91 ± 0.02 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0355
• Residual factor for significantly intense reflections: 0.0283
• Weighted residual factors for significantly intense reflections: 0.0574
• Weighted residual factors for all reflections included in the refinement: 0.0597
• Goodness-of-fit parameter for all reflections included in the refinement: 1.049
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No