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Information card for entry 4125097
Preview
| Coordinates | 4125097.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H18 Br2 N S7 Si2 |
|---|---|
| Calculated formula | C22 H19 Br2 N S6 Si2 |
| SMILES | c1(c(c2c(s1)sc1c2c2c3c4c5c(c(sc5sc4sc3[nH]c2s1)[Si](C)(C)C)Br)Br)[Si](C)(C)C |
| Title of publication | Radical Cation and Neutral Radical of Aza-thia[7]helicene with SOMO-HOMO Energy Level Inversion. |
| Authors of publication | Wang, Ying; Zhang, Hui; Pink, Maren; Olankitwanit, Arnon; Rajca, Suchada; Rajca, Andrzej |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 23 |
| Pages of publication | 7298 - 7304 |
| a | 21.1775 ± 0.0015 Å |
| b | 18.3158 ± 0.0013 Å |
| c | 7.0825 ± 0.0005 Å |
| α | 90° |
| β | 93.269 ± 0.002° |
| γ | 90° |
| Cell volume | 2742.7 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0268 |
| Residual factor for significantly intense reflections | 0.0227 |
| Weighted residual factors for significantly intense reflections | 0.0561 |
| Weighted residual factors for all reflections included in the refinement | 0.0578 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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