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Information card for entry 4125852
Preview
| Coordinates | 4125852.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C60 H68 F12 N4 O2 P2 |
|---|---|
| Calculated formula | C60 H68 F12 N4 O2 P2 |
| SMILES | c12ccc(C[n+]3ccc(cc3)c3cc[n+](cc3)Cc3ccc(cc3)c3ccc(cc3)C[n+]3ccc(c4cc[n+](Cc5ccc2cc5)cc4)cc3)cc1.CC(C)OC(C)C.[P](F)(F)(F)(F)(F)[F-].CC(C)OC(C)C.[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Size-Matched Radical Multivalency. |
| Authors of publication | Lipke, Mark C.; Cheng, Tao; Wu, Yilei; Arslan, Hasan; Xiao, Hai; Wasielewski, Michael R.; Goddard, William A.; Stoddart, J. Fraser |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2017 |
| a | 18.9571 ± 0.001 Å |
| b | 11.286 ± 0.0006 Å |
| c | 13.8878 ± 0.0008 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2971.3 ± 0.3 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 18 |
| Hermann-Mauguin space group symbol | P 21 21 2 |
| Hall space group symbol | P 2 2ab |
| Residual factor for all reflections | 0.0873 |
| Residual factor for significantly intense reflections | 0.0842 |
| Weighted residual factors for significantly intense reflections | 0.2506 |
| Weighted residual factors for all reflections included in the refinement | 0.2538 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.099 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4125852.html
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