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Information card for entry 4127187
Preview
| Coordinates | 4127187.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H48 Cl2 N O2 P Pd S |
|---|---|
| Calculated formula | C42 H48 Cl2 N O2 P Pd S |
| SMILES | [Pd]1([P](c2cccc3C(c4c(Oc23)c(ccc4)[C@H](NS(=[O]1)C(C)(C)C)C12CC3CC(CC(C1)C3)C2)(C)C)(c1ccccc1)c1ccccc1)(Cl)Cl |
| Title of publication | Palladium/PC-Phos-Catalyzed Enantioselective Arylation of General Sulfenate Anions: Scope and Synthetic Applications. |
| Authors of publication | Wang, Lei; Chen, Mingjie; Zhang, Peichao; Li, Wenbo; Zhang, Junliang |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| a | 12.2396 ± 0.0006 Å |
| b | 12.5554 ± 0.0006 Å |
| c | 25.4446 ± 0.0012 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3910.1 ± 0.3 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0369 |
| Residual factor for significantly intense reflections | 0.0301 |
| Weighted residual factors for significantly intense reflections | 0.0631 |
| Weighted residual factors for all reflections included in the refinement | 0.0671 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.074 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4127187.html
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