Information card for entry 4127216
| Common name |
compound 1 |
| Chemical name |
hexa-pery-hexabenzo[7]helicene peryleno[1',2',3':10,10a,1]phenanthro[9,8a,8-ab]perylene |
| Formula |
C48 H24 |
| Calculated formula |
C48 H24 |
| SMILES |
c1ccc2cccc3c4cccc5c6cccc7c8cccc9c%10cccc%11c%12cccc%13cccc(c(c(c(c(c1c23)c45)c67)c89)c%10%11)c%12%13 |
| Title of publication |
Hexa-peri-hexabenzo[7]helicene: Homogeneously π-Extended Helicene as a Primary Substructure of Helically Twisted Chiral Graphenes |
| Authors of publication |
Nakakuki, Yusuke; Hirose, Takashi; Sotome, Hikaru; Miyasaka, Hiroshi; Matsuda, Kenji |
| Journal of publication |
Journal of the American Chemical Society |
| Year of publication |
2018 |
| a |
8.8337 ± 0.0007 Å |
| b |
10.0588 ± 0.0008 Å |
| c |
16.3246 ± 0.0015 Å |
| α |
91.209 ± 0.002° |
| β |
95.437 ± 0.002° |
| γ |
95.278 ± 0.002° |
| Cell volume |
1437.2 ± 0.2 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
2 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.1547 |
| Residual factor for significantly intense reflections |
0.0839 |
| Weighted residual factors for significantly intense reflections |
0.1684 |
| Weighted residual factors for all reflections included in the refinement |
0.199 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.039 |
| Diffraction radiation wavelength |
0.71075 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4127216.html