Information card for entry 4127248
| Formula |
C27 H21 Cl6 N3 O18 Tb2 |
| Calculated formula |
C27 H21 Cl6 N3 O18 Tb2 |
| Title of publication |
Direct Radiation Detection by a Semiconductive Metal-Organic Framework. |
| Authors of publication |
Wang, Yaxing; Liu, Xin; Li, Xiaoyan; Zhai, Fuwan; Yan, Siqi; Liu, Ning; Chai, Zhifang; Xu, Yadong; Ouyang, Xiaoping; Wang, Shuao |
| Journal of publication |
Journal of the American Chemical Society |
| Year of publication |
2019 |
| a |
10.703 ± 0.003 Å |
| b |
16.17 ± 0.005 Å |
| c |
22.076 ± 0.006 Å |
| α |
90° |
| β |
92.57 ± 0.008° |
| γ |
90° |
| Cell volume |
3816.8 ± 1.9 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0672 |
| Residual factor for significantly intense reflections |
0.0495 |
| Weighted residual factors for significantly intense reflections |
0.1145 |
| Weighted residual factors for all reflections included in the refinement |
0.1214 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.052 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4127248.html