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Information card for entry 4127554
Preview
| Coordinates | 4127554.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | [BP2]Co(SiHPhCH2PiPr2)H2 |
|---|---|
| Formula | C33 H61 B Co P3 Si |
| Calculated formula | C33 H61 B Co P3 Si |
| SMILES | [CoH2]12([P](C(C)C)(C(C)C)CB(c3ccccc3)C[P]1(C(C)C)C(C)C)[P](C(C)C)(C(C)C)C[SiH]2c1ccccc1 |
| Title of publication | Activations of all Bonds to Silicon (Si-H, Si-C) in a Silane with Extrusion of [CoSiCo] Silicide Cores. |
| Authors of publication | Handford, Rex C.; Smith, Patrick W.; Tilley, T. Don |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 22 |
| Pages of publication | 8769 - 8772 |
| a | 13.211 ± 0.0006 Å |
| b | 19.7623 ± 0.001 Å |
| c | 13.6214 ± 0.0007 Å |
| α | 90° |
| β | 91.36 ± 0.002° |
| γ | 90° |
| Cell volume | 3555.3 ± 0.3 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.054 |
| Residual factor for significantly intense reflections | 0.0373 |
| Weighted residual factors for significantly intense reflections | 0.0775 |
| Weighted residual factors for all reflections included in the refinement | 0.0842 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.7288 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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