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Information card for entry 4128712
Preview
| Coordinates | 4128712.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H34 Cl8 Ga2 P2 Se2 |
|---|---|
| Calculated formula | C38 H34 Cl8 Ga2 P2 Se2 |
| SMILES | c1ccccc1[Se][P+](CC[P+](c1ccccc1)(c1ccccc1)[Se]c1ccccc1)(c1ccccc1)c1ccccc1.Cl[Ga](Cl)([Cl-])Cl.Cl[Ga](Cl)([Cl-])Cl |
| Title of publication | Chalcogen-Chalcogen Bonding Catalysis Enables Assembly of Discrete Molecules. |
| Authors of publication | Wang, Wei; Zhu, Haofu; Liu, Shuya; Zhao, Zhiguo; Zhang, Liang; Hao, Jingcheng; Wang, Yao |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 23 |
| Pages of publication | 9175 - 9179 |
| a | 10.113 ± 0.01 Å |
| b | 17.305 ± 0.016 Å |
| c | 15.793 ± 0.015 Å |
| α | 90° |
| β | 93.473 ± 0.013° |
| γ | 90° |
| Cell volume | 2759 ± 5 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1435 |
| Residual factor for significantly intense reflections | 0.0626 |
| Weighted residual factors for significantly intense reflections | 0.1193 |
| Weighted residual factors for all reflections included in the refinement | 0.1543 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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