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Information card for entry 4129115
Preview
| Coordinates | 4129115.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C33.75 H23.81 Al2 B0.51 N1.02 O10.21 |
|---|---|
| Calculated formula | C33.7464 H23.8134 Al2 B0.5075 N1.015 O10.2147 |
| Title of publication | Coordinative Alignment in the Pores of MOFs for the Structural Determination of N-, S-, and P-Containing Organic Compounds Including Complex Chiral Molecules. |
| Authors of publication | Pei, Xiaokun; Bürgi, Hans-Beat; Kapustin, Eugene A.; Liu, Yuzhong; Yaghi, Omar M. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| Journal volume | 141 |
| Journal issue | 47 |
| Pages of publication | 18862 - 18869 |
| a | 19.2915 ± 0.0005 Å |
| b | 19.2915 ± 0.0005 Å |
| c | 36.081 ± 0.0011 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 13428 ± 0.6 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 6 |
| Space group number | 94 |
| Hermann-Mauguin space group symbol | P 42 21 2 |
| Hall space group symbol | P 4n 2n |
| Residual factor for all reflections | 0.0572 |
| Residual factor for significantly intense reflections | 0.0544 |
| Weighted residual factors for significantly intense reflections | 0.1434 |
| Weighted residual factors for all reflections included in the refinement | 0.1479 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.07 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.7288 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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