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Information card for entry 4129475
Preview
| Coordinates | 4129475.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H52 Ni O2 P2 |
|---|---|
| Calculated formula | C24 H52 Ni O2 P2 |
| SMILES | [Ni]12([P](C(C)(C)C)(C(C)(C)C)CC[P]1(C(C)(C)C)C(C)(C)C)OC12CCCCC1.O |
| Title of publication | Synthesis of 2-Nickela(II)oxetanes from Nickel(0) and Epoxides: Structure, Reactivity, and a New Mechanism of Formation. |
| Authors of publication | Desnoyer, Addison N.; Bowes, Eric G.; Patrick, Brian O.; Love, Jennifer A. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2015 |
| Journal volume | 137 |
| Journal issue | 40 |
| Pages of publication | 12748 - 12751 |
| a | 11.1398 ± 0.0008 Å |
| b | 16.7554 ± 0.0012 Å |
| c | 15.4593 ± 0.0011 Å |
| α | 90° |
| β | 110.118 ± 0.002° |
| γ | 90° |
| Cell volume | 2709.5 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.047 |
| Residual factor for significantly intense reflections | 0.0313 |
| Weighted residual factors for significantly intense reflections | 0.0687 |
| Weighted residual factors for all reflections included in the refinement | 0.0746 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4129475.html
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Users of the data should acknowledge the original authors of the
structural data.