Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4129588
Preview
| Coordinates | 4129588.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H35 Y |
|---|---|
| Calculated formula | C22 H35 Y |
| SMILES | [Y]12345678([c]9([c]4([c]3([c]2([c]19C)C)C)C)C)([c]1([c]5([c]6([c]7([c]81C)C)C)C)C)CC |
| Title of publication | Synthesis, Structure, and Reactivity of the Ethyl Yttrium Metallocene, (C5Me5)2Y(CH2CH3), Including Activation of Methane. |
| Authors of publication | MacDonald, Matthew R.; Langeslay, Ryan R.; Ziller, Joseph W.; Evans, William J. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2015 |
| Journal volume | 137 |
| Journal issue | 46 |
| Pages of publication | 14716 - 14725 |
| a | 8.5822 ± 0.0008 Å |
| b | 14.0989 ± 0.0013 Å |
| c | 17.4406 ± 0.0017 Å |
| α | 90° |
| β | 101.906 ± 0.0013° |
| γ | 90° |
| Cell volume | 2064.9 ± 0.3 Å3 |
| Cell temperature | 143 ± 2 K |
| Ambient diffraction temperature | 143 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0685 |
| Residual factor for significantly intense reflections | 0.0375 |
| Weighted residual factors for significantly intense reflections | 0.0753 |
| Weighted residual factors for all reflections included in the refinement | 0.0851 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4129588.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.