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Information card for entry 4129755
Preview
| Coordinates | 4129755.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C50 H45 F24 N7 P4 Se2 |
|---|---|
| Calculated formula | C50 H45 F24 N7 P4 Se2 |
| Title of publication | Energy and Electron Transfer Dynamics within a Series of Perylene Diimide/Cyclophane Systems. |
| Authors of publication | Ryan, Seán T J; Young, Ryan M.; Henkelis, James J.; Hafezi, Nema; Vermeulen, Nicolaas A.; Hennig, Andreas; Dale, Edward J.; Wu, Yilei; Krzyaniak, Matthew D.; Fox, Athan; Nau, Werner M.; Wasielewski, Michael R.; Stoddart, J. Fraser; Scherman, Oren A. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2015 |
| Journal volume | 137 |
| Journal issue | 48 |
| Pages of publication | 15299 - 15307 |
| a | 10.1807 ± 0.0002 Å |
| b | 11.1872 ± 0.0003 Å |
| c | 14.0332 ± 0.0004 Å |
| α | 101.093 ± 0.002° |
| β | 92.183 ± 0.002° |
| γ | 102.516 ± 0.002° |
| Cell volume | 1525.84 ± 0.07 Å3 |
| Cell temperature | 220 ± 2 K |
| Ambient diffraction temperature | 220 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0717 |
| Residual factor for significantly intense reflections | 0.0587 |
| Weighted residual factors for significantly intense reflections | 0.1624 |
| Weighted residual factors for all reflections included in the refinement | 0.175 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.07 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4129755.html
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Users of the data should acknowledge the original authors of the
structural data.