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Information card for entry 4129895
Preview
| Coordinates | 4129895.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H2 Br2 F10 Te |
|---|---|
| Calculated formula | C16 H2 Br2 F10 Te |
| SMILES | C1=C(c2c(F)c(c(c(c2F)F)F)F)[Te](Br)(C(=C1)c1c(c(c(c(c1F)F)F)F)F)Br |
| Title of publication | A Mechanistic Study of Halogen Addition and Photoelimination from π-Conjugated Tellurophenes. |
| Authors of publication | Carrera, Elisa I.; Lanterna, Anabel E.; Lough, Alan J.; Scaiano, Juan C.; Seferos, Dwight S. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 8 |
| Pages of publication | 2678 - 2689 |
| a | 18.1548 ± 0.0011 Å |
| b | 10.5369 ± 0.0007 Å |
| c | 9.3957 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1797.35 ± 0.19 Å3 |
| Cell temperature | 147 ± 2 K |
| Ambient diffraction temperature | 147 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0315 |
| Residual factor for significantly intense reflections | 0.021 |
| Weighted residual factors for significantly intense reflections | 0.0422 |
| Weighted residual factors for all reflections included in the refinement | 0.0452 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4129895.html
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Users of the data should acknowledge the original authors of the
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