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Information card for entry 4129977
Preview
| Coordinates | 4129977.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C54.25 H34 Cd2 N13 O15 |
|---|---|
| Calculated formula | C54 H34 Cd2 N12.861 O14.722 |
| Title of publication | Selective Formation of Conductive Network by Radical-Induced Oxidation. |
| Authors of publication | Koo, Jin Young; Yakiyama, Yumi; Lee, Gil Ryeong; Lee, Jinho; Choi, Hee Cheul; Morita, Yasushi; Kawano, Masaki |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 6 |
| Pages of publication | 1776 - 1779 |
| a | 8.6935 ± 0.0001 Å |
| b | 25.5171 ± 0.0005 Å |
| c | 32.5555 ± 0.0007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7221.9 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 18 |
| Hermann-Mauguin space group symbol | P 2 21 21 |
| Hall space group symbol | P 2bc 2 |
| Residual factor for all reflections | 0.0877 |
| Residual factor for significantly intense reflections | 0.0673 |
| Weighted residual factors for significantly intense reflections | 0.1865 |
| Weighted residual factors for all reflections included in the refinement | 0.1955 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.977 |
| Diffraction radiation wavelength | 0.6889 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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