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Information card for entry 4130785
Preview
| Coordinates | 4130785.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C313 H183 F48 Fe4 N26 Sb8 |
|---|---|
| Calculated formula | C313 H183 F23.1 Fe4 N26 Sb3.85 |
| Title of publication | Pathway-Dependent Post-assembly Modification of an Anthracene-Edged M(II)4L6 Tetrahedron. |
| Authors of publication | Ronson, Tanya K.; Pilgrim, Ben S.; Nitschke, Jonathan R. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 33 |
| Pages of publication | 10417 - 10420 |
| a | 21.8874 ± 0.0008 Å |
| b | 27.4261 ± 0.0009 Å |
| c | 30.8088 ± 0.0009 Å |
| α | 64.666 ± 0.002° |
| β | 87.269 ± 0.002° |
| γ | 79.937 ± 0.002° |
| Cell volume | 16450.7 ± 1 Å3 |
| Cell temperature | 180 ± 2 K |
| Ambient diffraction temperature | 180 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1308 |
| Residual factor for significantly intense reflections | 0.109 |
| Weighted residual factors for significantly intense reflections | 0.3123 |
| Weighted residual factors for all reflections included in the refinement | 0.3387 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.045 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4130785.html
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