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Information card for entry 4130856
Preview
| Coordinates | 4130856.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H34 Cu F4 N3 O2 |
|---|---|
| Calculated formula | C32 H34 Cu F4 N3 O2 |
| SMILES | [Cu](N(C(=O)OC(C)(C)C)c1c(c(cc(c1F)F)F)F)=C1N(C=CN1c1c(C)cc(C)cc1C)c1c(C)cc(C)cc1C |
| Title of publication | (NHC)Cu-Catalyzed Mild C-H Amidation of (Hetero)arenes with Deprotectable Carbamates: Scope and Mechanistic Studies. |
| Authors of publication | Xie, Weilong; Yoon, Jung Hee; Chang, Sukbok |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2016 |
| Journal volume | 138 |
| Journal issue | 38 |
| Pages of publication | 12605 - 12614 |
| a | 9.9952 ± 0.0007 Å |
| b | 11.0255 ± 0.0007 Å |
| c | 16.6818 ± 0.0011 Å |
| α | 107.292 ± 0.003° |
| β | 93.899 ± 0.003° |
| γ | 113.654 ± 0.003° |
| Cell volume | 1570.52 ± 0.19 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.057 |
| Residual factor for significantly intense reflections | 0.0439 |
| Weighted residual factors for significantly intense reflections | 0.1131 |
| Weighted residual factors for all reflections included in the refinement | 0.1289 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.111 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4130856.html
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structural data.