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Information card for entry 4131336
Preview
| Coordinates | 4131336.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C54 H45 F12 Fe N9 P2 |
|---|---|
| Calculated formula | C54 H45 F12 Fe N9 P2 |
| Title of publication | Electrochromic Metallo-Organic Nanoscale Films: Fabrication, Color Range, and Devices. |
| Authors of publication | Elool Dov, Neta; Shankar, Sreejith; Cohen, Dana; Bendikov, Tatyana; Rechav, Katya; Shimon, Linda J. W.; Lahav, Michal; van der Boom, Milko E. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2017 |
| Journal volume | 139 |
| Journal issue | 33 |
| Pages of publication | 11471 - 11481 |
| a | 15.2797 ± 0.0011 Å |
| b | 21.3748 ± 0.0015 Å |
| c | 21.7718 ± 0.0015 Å |
| α | 74.223 ± 0.01° |
| β | 77.054 ± 0.01° |
| γ | 79.381 ± 0.011° |
| Cell volume | 6610.9 ± 0.9 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1296 |
| Residual factor for significantly intense reflections | 0.0776 |
| Weighted residual factors for significantly intense reflections | 0.1985 |
| Weighted residual factors for all reflections included in the refinement | 0.2301 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.937 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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