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Information card for entry 4131422
Preview
| Coordinates | 4131422.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C91 H106 F6 Si4 |
|---|---|
| Calculated formula | C91 H106 F6 Si4 |
| Title of publication | Tuning Singlet Fission in π-Bridge-π Chromophores. |
| Authors of publication | Kumarasamy, Elango; Sanders, Samuel N.; Tayebjee, Murad J. Y.; Asadpoordarvish, Amir; Hele, Timothy J. H.; Fuemmeler, Eric G.; Pun, Andrew B.; Yablon, Lauren M.; Low, Jonathan Z.; Paley, Daniel W.; Dean, Jacob C.; Choi, Bonnie; Scholes, Gregory D.; Steigerwald, Michael L.; Ananth, Nandini; McCamey, Dane R.; Sfeir, Matthew Y.; Campos, Luis M. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2017 |
| Journal volume | 139 |
| Journal issue | 36 |
| Pages of publication | 12488 - 12494 |
| a | 26.5637 ± 0.0005 Å |
| b | 7.89746 ± 0.00009 Å |
| c | 41.3109 ± 0.0009 Å |
| α | 90° |
| β | 106.605 ± 0.002° |
| γ | 90° |
| Cell volume | 8305 ± 0.3 Å3 |
| Cell temperature | 99.8 ± 0.5 K |
| Ambient diffraction temperature | 99.8 ± 0.5 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0781 |
| Residual factor for significantly intense reflections | 0.0726 |
| Weighted residual factors for significantly intense reflections | 0.1983 |
| Weighted residual factors for all reflections included in the refinement | 0.2035 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.107 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4131422.html
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Users of the data should acknowledge the original authors of the
structural data.