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Information card for entry 4132559
Preview
| Coordinates | 4132559.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C46 H59 Cr N2 P Si |
|---|---|
| Calculated formula | C46 H59 Cr N2 P Si |
| SMILES | [Cr]([P](c1ccccc1)(c1ccccc1)c1ccccc1)(=Nc1c(cccc1C(C)C)C(C)C)(=Nc1c(cccc1C(C)C)C(C)C)=C[Si](C)(C)C |
| Title of publication | Structure and Reactivity of Chromium(VI) Alkylidenes. |
| Authors of publication | Wu, Pengcheng; Yap, Glenn P. A.; Theopold, Klaus H. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| Journal volume | 140 |
| Journal issue | 23 |
| Pages of publication | 7088 - 7091 |
| a | 17.0985 ± 0.0011 Å |
| b | 13.5512 ± 0.0009 Å |
| c | 21.4178 ± 0.0014 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4962.6 ± 0.6 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 29 |
| Hermann-Mauguin space group symbol | P c a 21 |
| Hall space group symbol | P 2c -2ac |
| Residual factor for all reflections | 0.0588 |
| Residual factor for significantly intense reflections | 0.0424 |
| Weighted residual factors for significantly intense reflections | 0.1053 |
| Weighted residual factors for all reflections included in the refinement | 0.1155 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4132559.html
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Users of the data should acknowledge the original authors of the
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