Information card for entry 4133950
| Formula |
C44 H42 Cl2 Si2 |
| Calculated formula |
C44 H42 Cl2 Si2 |
| SMILES |
Clc1c2c3c4c(c(c5ccc(Cl)c(c6c7c(c(c(cc1)c26)C#C[Si](CC)(CC)CC)cccc7)c35)C#C[Si](CC)(CC)CC)cccc4 |
| Title of publication |
Rational Functionalization of a C<sub>70</sub> Buckybowl To Enable a C<sub>70</sub>:Buckybowl Cocrystal for Organic Semiconductor Applications. |
| Authors of publication |
Gao, Guangpeng; Chen, Meng; Roberts, Josiah; Feng, Meng; Xiao, Chengyi; Zhang, Guowei; Parkin, Sean; Risko, Chad; Zhang, Lei |
| Journal of publication |
Journal of the American Chemical Society |
| Year of publication |
2020 |
| a |
11.8645 ± 0.0002 Å |
| b |
24.612 ± 0.0003 Å |
| c |
14.0385 ± 0.0002 Å |
| α |
90° |
| β |
112.963 ± 0.002° |
| γ |
90° |
| Cell volume |
3774.52 ± 0.11 Å3 |
| Cell temperature |
169.99 ± 0.1 K |
| Ambient diffraction temperature |
169.99 ± 0.1 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0443 |
| Residual factor for significantly intense reflections |
0.0393 |
| Weighted residual factors for significantly intense reflections |
0.1063 |
| Weighted residual factors for all reflections included in the refinement |
0.1135 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.057 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/4133950.html