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Information card for entry 4133985
Preview
| Coordinates | 4133985.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Cs8 In27 Sb19 |
|---|---|
| Calculated formula | Cs8 In27 Sb19 |
| Title of publication | III-V Clathrate Semiconductors with Outstanding Hole Mobility: Cs<sub>8</sub>In<sub>27</sub>Sb<sub>19</sub> and <i>A</i><sub>8</sub>Ga<sub>27</sub>Sb<sub>19</sub> (<i>A</i> = Cs, Rb). |
| Authors of publication | Owens-Baird, Bryan; Wang, Jian; Wang, Suyin Grass; Chen, Yu-Sheng; Lee, Shannon; Donadio, Davide; Kovnir, Kirill |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2020 |
| Journal volume | 142 |
| Journal issue | 4 |
| Pages of publication | 2031 - 2041 |
| a | 24.4593 ± 0.0007 Å |
| b | 24.4593 ± 0.0007 Å |
| c | 24.4593 ± 0.0007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 14633 ± 0.7 Å3 |
| Cell temperature | 10 ± 2 K |
| Ambient diffraction temperature | 10 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 206 |
| Hermann-Mauguin space group symbol | I a -3 |
| Hall space group symbol | -I 2b 2c 3 |
| Residual factor for all reflections | 0.0134 |
| Residual factor for significantly intense reflections | 0.0112 |
| Weighted residual factors for significantly intense reflections | 0.0331 |
| Weighted residual factors for all reflections included in the refinement | 0.0384 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.193 |
| Diffraction radiation wavelength | 0.24797 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4133985.html
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