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Information card for entry 4134594
Preview
| Coordinates | 4134594.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C98 H78 N2 O4 |
|---|---|
| Calculated formula | C98 H78 N2 O4 |
| SMILES | N1(C(CCCCC)CCCCC)C(=O)c2c3c4c5c6c7c8c(C(=O)N(C(CCCCC)CCCCC)C(=O)c8cc8c7c4c(c2)c2c4c7c(ccc4ccc82)ccc2ccc4c(c72)c2ccccc2cc4)cc6c2ccc4c(c2c5cc3C1=O)c1c(cc4)ccc2ccc3ccc4ccccc4c3c12 |
| Title of publication | Perylene Diimide-Embedded Double [8]Helicenes. |
| Authors of publication | Liu, Bo; Böckmann, Marcus; Jiang, Wei; Doltsinis, Nikos L.; Wang, Zhaohui |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2020 |
| a | 16.3803 ± 0.0003 Å |
| b | 29.3997 ± 0.0006 Å |
| c | 34.6846 ± 0.0005 Å |
| α | 70.914 ± 0.002° |
| β | 88.745 ± 0.001° |
| γ | 88.207 ± 0.001° |
| Cell volume | 15776.1 ± 0.5 Å3 |
| Cell temperature | 169.99 ± 0.13 K |
| Ambient diffraction temperature | 169.99 ± 0.13 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.2294 |
| Residual factor for significantly intense reflections | 0.1979 |
| Weighted residual factors for significantly intense reflections | 0.4492 |
| Weighted residual factors for all reflections included in the refinement | 0.478 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.782 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4134594.html
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Users of the data should acknowledge the original authors of the
structural data.