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Information card for entry 4135018
Preview
| Coordinates | 4135018.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H80 I2 Si12 |
|---|---|
| Calculated formula | C32 H80 I2 Si12 |
| SMILES | [Si]12([Si]([Si]31C([Si](C)(C)C)([Si](C)(C)C)CCC3([Si](C)(C)C)[Si](C)(C)C)([Si]12C([Si](C)(C)C)([Si](C)(C)C)CCC1([Si](C)(C)C)[Si](C)(C)C)I)I |
| Title of publication | An Isolable Tetrasilicon Analogue of a Planar Bicyclo[1.1.0]butane with π-Type Single-Bonding Character. |
| Authors of publication | Nukazawa, Takumi; Iwamoto, Takeaki |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2020 |
| Journal volume | 142 |
| Journal issue | 22 |
| Pages of publication | 9920 - 9924 |
| a | 11.6852 ± 0.0003 Å |
| b | 14.2348 ± 0.0004 Å |
| c | 17.0541 ± 0.0005 Å |
| α | 68.082 ± 0.001° |
| β | 78.177 ± 0.001° |
| γ | 76.52 ± 0.001° |
| Cell volume | 2537.24 ± 0.12 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0464 |
| Residual factor for significantly intense reflections | 0.0313 |
| Weighted residual factors for significantly intense reflections | 0.0618 |
| Weighted residual factors for all reflections included in the refinement | 0.0687 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4135018.html
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Users of the data should acknowledge the original authors of the
structural data.