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Information card for entry 4300152
Preview
| Coordinates | 4300152.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C72 H60 N3 P6 S6 Y |
|---|---|
| Calculated formula | C72 H60 N3 P6 S6 Y |
| SMILES | c1ccccc1P1(=[N]2[Y]3456([N](P(c7ccccc7)(c7ccccc7)=[S]3)=P(c3ccccc3)(c3ccccc3)S5)([N](=P(c3ccccc3)(c3ccccc3)S4)P(c3ccccc3)(c3ccccc3)=[S]6)(S1)[S]=P2(c1ccccc1)c1ccccc1)c1ccccc1 |
| Title of publication | Soluble Yttrium Chalcogenides: Syntheses, Structures, and NMR Properties of Y[η3-N(SPPh2)2]3 and Y[η2-N(SePPh2)2]2[η3-N(SePPh2)2] |
| Authors of publication | Christopher G. Pernin; James A. Ibers |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2000 |
| Journal volume | 39 |
| Pages of publication | 1222 - 1226 |
| a | 14.927 ± 0.005 Å |
| b | 14.927 ± 0.005 Å |
| c | 56.047 ± 0.013 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 10815 ± 6 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 167 |
| Hermann-Mauguin space group symbol | R -3 c :H |
| Hall space group symbol | -R 3 2"c |
| Residual factor for all reflections | 0.0822 |
| Residual factor for significantly intense reflections | 0.0424 |
| Weighted residual factors for significantly intense reflections | 0.0797 |
| Weighted residual factors for all reflections included in the refinement | 0.0908 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.938 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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