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Information card for entry 4300864
Preview
| Coordinates | 4300864.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Se-Se-N gallate |
|---|---|
| Chemical name | 3H-naphtho[1,2-d][1,2,3]diselenazolylium tetrachlorogallate |
| Formula | C10 H6 Cl4 Ga N Se2 |
| Calculated formula | C10 H6 Cl4 Ga N Se2 |
| SMILES | [Ga](Cl)(Cl)(Cl)[Cl-].[Se]1[Se+]=Nc2ccc3c(c12)cccc3 |
| Title of publication | Naphthalene-1,2,3-Dithiazolyl and Its Selenium-Containing Variants |
| Authors of publication | Richard T. Oakley; Robert W. Reed; Craig M. Robertson; John F. Richardson |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2005 |
| Journal volume | 44 |
| Pages of publication | 1837 - 1845 |
| a | 7.79 ± 0.004 Å |
| b | 10.009 ± 0.005 Å |
| c | 10.109 ± 0.005 Å |
| α | 100.53 ± 0.007° |
| β | 104.778 ± 0.008° |
| γ | 92.76 ± 0.008° |
| Cell volume | 745.6 ± 0.7 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0742 |
| Residual factor for significantly intense reflections | 0.0444 |
| Weighted residual factors for significantly intense reflections | 0.1002 |
| Weighted residual factors for all reflections included in the refinement | 0.1117 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.012 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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