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Information card for entry 4300910
Preview
| Coordinates | 4300910.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H38 As Ga I N2 Si2 |
|---|---|
| Calculated formula | C16 H38 As Ga I N2 Si2 |
| SMILES | [I][Ga]1([As]([Si](C)(C)C)[Si](C)(C)C)[N](=CC=[N]1C(C)(C)C)C(C)(C)C |
| Title of publication | Reactions of a Gallium(II)-Diazabutadiene Dimer, [{{[(H)C(But)N]2}GaI}2], with [ME(SiMe3)2] (M = Li or Na; E = N, P, or As): Structural, EPR, and ENDOR Characterization of Paramagnetic Gallium(III) Pnictide Complexes |
| Authors of publication | Karen L. Antcliff; Robert J. Baker; Cameron Jones; Damien M. Murphy; Richard P. Rose |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2005 |
| Journal volume | 44 |
| Pages of publication | 2098 - 2105 |
| a | 15.009 ± 0.003 Å |
| b | 18.462 ± 0.004 Å |
| c | 9.335 ± 0.0019 Å |
| α | 90° |
| β | 92.77 ± 0.03° |
| γ | 90° |
| Cell volume | 2583.7 ± 0.9 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1136 |
| Residual factor for significantly intense reflections | 0.0766 |
| Weighted residual factors for significantly intense reflections | 0.186 |
| Weighted residual factors for all reflections included in the refinement | 0.2097 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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