Information card for entry 4301186

Structure parameters

• Formula: C52 H82 N8 O2 Si4 Yb2
• Calculated formula: C52 H82 N8 O2 Si4 Yb2
• SMILES: C1(c2ccccc2)N([Si](C)(C)C)[Yb]2345[N]=1CCC[N]1=C(N([Si](C)(C)C)[Yb]61([O]3C(C)C)(N([Si](C)(C)C)C(c1ccccc1)=[N]6CCC[N]2=C(N5[Si](C)(C)C)c1ccccc1)[O]4C(C)C)c1ccccc1
• Title of publication: Bridged Bis(amidinate) Ytterbium Alkoxide and Phenoxide: Syntheses, Structures, and Their High Activity for Controlled Polymerization of l-Lactide and ε-Caprolactone
• Authors of publication: Junfeng Wang; Yingming Yao; Yong Zhang; Qi Shen
• Journal of publication: Inorganic Chemistry
• Year of publication: 2009
• Journal volume: 48
• Pages of publication: 744 - 751
• a: 10.5426 ± 0.0003 Å
• b: 10.7834 ± 0.0005 Å
• c: 15.2118 ± 0.0006 Å
• α: 109.501 ± 0.009°
• β: 99.684 ± 0.009°
• γ: 104.004 ± 0.012°
• Cell volume: 1522 ± 0.2 ų
• Cell temperature: 193 ± 2 K
• Ambient diffraction temperature: 193 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0301
• Residual factor for significantly intense reflections: 0.0269
• Weighted residual factors for significantly intense reflections: 0.0618
• Weighted residual factors for all reflections included in the refinement: 0.0636
• Goodness-of-fit parameter for all reflections included in the refinement: 1.125
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No