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Information card for entry 4301614
Preview
| Coordinates | 4301614.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H59 Al N2 O Sn |
|---|---|
| Calculated formula | C48 H59 Al N2 O Sn |
| SMILES | [Sn](O[Al]1(N(C(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C)C)(c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Preparation and Structural Characterization of Molecular Al-O-Sn(II) and Al-O-Sn(IV) Compounds |
| Authors of publication | Sharanappa Nembenna; Sanjay Singh; Anukul Jana; Herbert W. Roesky; Ying Yang; Hongqi Ye; Holger Ott; Dietmar Stalke |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2009 |
| Journal volume | 48 |
| Pages of publication | 2273 - 2276 |
| a | 11.46 ± 0.0008 Å |
| b | 11.5128 ± 0.0008 Å |
| c | 16.7507 ± 0.0012 Å |
| α | 84.52 ± 0.001° |
| β | 84.951 ± 0.001° |
| γ | 81.884 ± 0.001° |
| Cell volume | 2171.7 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0278 |
| Residual factor for significantly intense reflections | 0.0238 |
| Weighted residual factors for significantly intense reflections | 0.0543 |
| Weighted residual factors for all reflections included in the refinement | 0.0558 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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