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Information card for entry 4301676
Preview
| Coordinates | 4301676.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [SiPiPr3]NiCl |
|---|---|
| Formula | C42 H60 Cl Ni P3 Si |
| Calculated formula | C42 H60 Cl Ni P3 Si |
| SMILES | [Ni]123([P](C(C)C)(C(C)C)c4ccccc4[Si]3(c3c([P]2(C(C)C)C(C)C)cccc3)c2c([P]1(C(C)C)C(C)C)cccc2)Cl.c1ccccc1 |
| Title of publication | Dinitrogen Complexes Supported by Tris(phosphino)silyl Ligands |
| Authors of publication | Matthew T. Whited; Neal P. Mankad; Yunho Lee; Paul F. Oblad; Jonas C. Peters |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2009 |
| Journal volume | 48 |
| Pages of publication | 2507 - 2517 |
| a | 12.916 ± 0.004 Å |
| b | 15.54 ± 0.003 Å |
| c | 20.13 ± 0.005 Å |
| α | 90° |
| β | 92.32 ± 0.03° |
| γ | 90° |
| Cell volume | 4037.1 ± 1.8 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1087 |
| Residual factor for significantly intense reflections | 0.0509 |
| Weighted residual factors for significantly intense reflections | 0.082 |
| Weighted residual factors for all reflections included in the refinement | 0.0908 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.164 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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