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Information card for entry 4302176
Preview
| Coordinates | 4302176.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C50 H51 Ga P2 Ru |
|---|---|
| Calculated formula | C50 H51 Ga P2 Ru |
| SMILES | [Ru]123([Ga]4567[c]8([c]7([c]6([c]5([c]48C)C)C)C)C)([P](c4ccccc4)(c4ccccc4)c4ccccc4)([P](c4ccccc4)(c4ccccc4)c4ccccc4)[CH2]=[CH]1[CH]2=[CH2]3 |
| Title of publication | Syntheses and Crystal Structures of Ruthenium and Rhodium Olefin Complexes Containing GaCp* |
| Authors of publication | Thomas Cadenbach; Christian Gemel; Timo Bollermann; Roland A. Fischer |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2009 |
| Journal volume | 48 |
| Pages of publication | 5021 - 5026 |
| a | 11.345 ± 0.003 Å |
| b | 13.493 ± 0.003 Å |
| c | 14.575 ± 0.004 Å |
| α | 89.35 ± 0.02° |
| β | 68.43 ± 0.02° |
| γ | 83.562 ± 0.019° |
| Cell volume | 2060.7 ± 1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1236 |
| Residual factor for significantly intense reflections | 0.0448 |
| Weighted residual factors for significantly intense reflections | 0.0528 |
| Weighted residual factors for all reflections included in the refinement | 0.069 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.751 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4302176.html
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