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Information card for entry 4302636
Preview
| Coordinates | 4302636.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H37 B5 Cl W2 |
|---|---|
| Calculated formula | C20 H37 B5 Cl W2 |
| Title of publication | Chlorinated Hypoelectronic Dimetallaborane Clusters: Synthesis, Characterization, and Electronic Structures of (η5-C5Me5W)2B5HnClm (n= 7,m= 2 and n= 8,m= 1) |
| Authors of publication | Satyanarayan Sahoo; K. Hari Krishna Reddy; Rajendra S. Dhayal; Shaikh M. Mobin; V. Ramkumar; E. D. Jemmis; Sundargopal Ghosh |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2009 |
| Journal volume | 48 |
| Pages of publication | 6509 - 6516 |
| a | 8.7448 ± 0.0004 Å |
| b | 9.5666 ± 0.0006 Å |
| c | 15.078 ± 0.0006 Å |
| α | 100.489 ± 0.004° |
| β | 95.436 ± 0.004° |
| γ | 98.75 ± 0.004° |
| Cell volume | 1216.12 ± 0.11 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0356 |
| Residual factor for significantly intense reflections | 0.0242 |
| Weighted residual factors for significantly intense reflections | 0.0553 |
| Weighted residual factors for all reflections included in the refinement | 0.0582 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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