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Information card for entry 4302812
Preview
| Coordinates | 4302812.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Al0.38Dy3(Si0.85Al0.15)S7 |
|---|---|
| Chemical name | Al0.38Dy3(Si0.85Al0.15)S7 |
| Formula | Al0.53 Dy3 S7 Si0.85 |
| Calculated formula | Al0.5362 Dy3 S7 Si0.8479 |
| Title of publication | A Series of New Infrared NLO Semiconductors, ZnY6Si2S14, AlxDy3(SiyAl1-y)S7, and Al0.33Sm3SiS7 |
| Authors of publication | Sheng-Ping Guo; Guo-Cong Guo; Ming-Sheng Wang; Jian-Ping Zou; Gang Xu; Guo-Jian Wang; Xi-Fa Long; Jin-Shun Huang |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2009 |
| Journal volume | 48 |
| Pages of publication | 7059 - 7065 |
| a | 9.7755 ± 0.0013 Å |
| b | 9.7755 ± 0.0013 Å |
| c | 5.6821 ± 0.0013 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 470.24 ± 0.14 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 173 |
| Hermann-Mauguin space group symbol | P 63 |
| Hall space group symbol | P 6c |
| Residual factor for all reflections | 0.0233 |
| Residual factor for significantly intense reflections | 0.0226 |
| Weighted residual factors for significantly intense reflections | 0.0573 |
| Weighted residual factors for all reflections included in the refinement | 0.0581 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.011 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4302812.html
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Users of the data should acknowledge the original authors of the
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