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Information card for entry 4304798
Preview
| Coordinates | 4304798.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C23 H52 N Ni O P2 Si2 |
|---|---|
| Calculated formula | C23 H52 N Ni O P2 Si2 |
| Title of publication | Influence of the d-Electron Count on CO Binding by Three-Coordinate [(tBu2PCH2SiMe2)2N]Fe, -Co, and -Ni |
| Authors of publication | Michael J. Ingleson; Benjamin C. Fullmer; Drew T. Buschhorn; Hongjun Fan; Maren Pink; John C. Huffman; Kenneth G. Caulton |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2008 |
| Journal volume | 47 |
| Pages of publication | 407 - 409 |
| a | 18.178 ± 0.005 Å |
| b | 10.173 ± 0.003 Å |
| c | 16.417 ± 0.005 Å |
| α | 90° |
| β | 98.744 ± 0.006° |
| γ | 90° |
| Cell volume | 3000.6 ± 1.5 Å3 |
| Cell temperature | 130 ± 2 K |
| Ambient diffraction temperature | 130 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0728 |
| Residual factor for significantly intense reflections | 0.046 |
| Weighted residual factors for significantly intense reflections | 0.1022 |
| Weighted residual factors for all reflections included in the refinement | 0.1105 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.928 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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