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Information card for entry 4305093
Preview
| Coordinates | 4305093.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H40 Cl2 Cr N2 O2 |
|---|---|
| Calculated formula | C28 H40 Cl2 Cr N2 O2 |
| SMILES | [Cr]1([N](c2c(cccc2C)C)=C(C(=[N]1c1c(cccc1C)C)C)C)([O]1CCCC1)([O]1CCCC1)(Cl)Cl |
| Title of publication | Synthesis, Characterization, and Electronic Structure of Diimine Complexes of Chromium |
| Authors of publication | Kevin A. Kreisel; Glenn P. A. Yap; Klaus H. Theopold |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2008 |
| Journal volume | 47 |
| Pages of publication | 5293 - 5303 |
| a | 8.231 ± 0.005 Å |
| b | 11.436 ± 0.007 Å |
| c | 15.594 ± 0.009 Å |
| α | 77.112 ± 0.008° |
| β | 78.381 ± 0.009° |
| γ | 82.698 ± 0.008° |
| Cell volume | 1396.4 ± 1.5 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0446 |
| Residual factor for significantly intense reflections | 0.0429 |
| Weighted residual factors for significantly intense reflections | 0.1183 |
| Weighted residual factors for all reflections included in the refinement | 0.1203 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.021 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4305093.html
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