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Information card for entry 4305095
Preview
| Coordinates | 4305095.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C60 H90 Cl2 Cr2 N4 O2 |
|---|---|
| Calculated formula | C60 H90 Cl2 Cr2 N4 O2 |
| SMILES | [Cr]12(N(C=CN2c2c(cccc2C(C)C)C(C)C)c2c(cccc2C(C)C)C(C)C)[Cl][Cr]2(N(C=CN2c2c(cccc2C(C)C)C(C)C)c2c(cccc2C(C)C)C(C)C)([Cl]1)[O]1CCCC1.O(CC)CC |
| Title of publication | Synthesis, Characterization, and Electronic Structure of Diimine Complexes of Chromium |
| Authors of publication | Kevin A. Kreisel; Glenn P. A. Yap; Klaus H. Theopold |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2008 |
| Journal volume | 47 |
| Pages of publication | 5293 - 5303 |
| a | 12.689 ± 0.005 Å |
| b | 13.439 ± 0.006 Å |
| c | 18.554 ± 0.008 Å |
| α | 82.489 ± 0.007° |
| β | 75.715 ± 0.006° |
| γ | 82.121 ± 0.006° |
| Cell volume | 3022 ± 2 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.068 |
| Residual factor for significantly intense reflections | 0.0588 |
| Weighted residual factors for significantly intense reflections | 0.1406 |
| Weighted residual factors for all reflections included in the refinement | 0.1499 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.061 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4305095.html
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Users of the data should acknowledge the original authors of the
structural data.