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Information card for entry 4306609
Preview
| Coordinates | 4306609.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C3 K9.75 Na1.25 Ni9 O107.5 Si2 W18 |
|---|---|
| Calculated formula | C3 K9.75 Na1.25 Ni9 O107.5 Si2 W18 |
| SMILES | [W]1234(=O)O[W]567(O[W]89(O1)(O[W]1%10%11(O[W]%12%13(O2)([O]24[W]4(O3)(O%13)(=O)O[W]3%13(O[W]%14%15(O4)(=[O][Ni]4%16%17%18[O]%15([W](O%12)(O%14)(=O)(=[O]4)O1)[Si]12[O]8%11[Ni]2([O]=%10)([O]=9)([O]4[Ni]89([O]=5)([O]731)[O]%13[Ni]([O]9C1[O]3[Ni]54([O]%168)([O]%172)OC(=O)O[Ni]2473[O]5C(O%18)=[O][Ni]3589[O]=[W]%10%11%12(O[W]%13%14%15(O[W]%16%17%18(=O)=[O][Ni]%19([O]%13%18[Si]%13%18[O]3%12[W]3(O%10)(=O)(=[O]5)O[W]5%10%12(=O)=[O][Ni]%20([O]%13%12[W](O%16)(O%10)(=O)(=[O]%20)O[W]%10%12(O%17)(=O)O[W]%13(O3)(O5)([O]%18%12[W](O%15)(O%11)(O%10)(=O)O%13)=O)([O]28)([O]4%19)[O]=1)([O]=%14)([O]79)[OH2])=O)=O)([OH2])([OH2])([OH2])[OH2])[OH2])=O)(O6)=O)=O)=O)=O)=O.[K+].[K+].[K+].[K+].[K+].[K+].[K+].[K+].[K+].[K+].[Na+].O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O.O |
| Title of publication | Octa- and Nonanuclear Nickel(II) Polyoxometalate Clusters: Synthesis and Electrochemical and Magnetic Characterizations |
| Authors of publication | Céline Pichon; Pierre Mialane; Anne Dolbecq; Jérôme Marrot; Eric Rivière; Bassem S. Bassil; Ulrich Kortz; Bineta Keita; Louis Nadjo; Francis Sécheresse |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2008 |
| Journal volume | 47 |
| Pages of publication | 11120 - 11128 |
| a | 13.6466 ± 0.0005 Å |
| b | 22.9583 ± 0.0008 Å |
| c | 23.234 ± 0.0008 Å |
| α | 63.423 ± 0.002° |
| β | 73.476 ± 0.001° |
| γ | 89.82 ± 0.002° |
| Cell volume | 6175.5 ± 0.4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1001 |
| Residual factor for significantly intense reflections | 0.057 |
| Weighted residual factors for significantly intense reflections | 0.154 |
| Weighted residual factors for all reflections included in the refinement | 0.1938 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.046 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4306609.html
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